Labtron Equipment Ltd / Chromatography / Gas chromatography mass spectrometry GC_MS_879

 

Description

Gas chromatography mass spectrometry GC-MS is a high precision Gas chromatograph mass spectrometer with pre-filter mass analyzer and electron multiplier ensuring high sensitivity. Desorption for solids is performed at controlled temperature between 100 ~ 350 °C with a flow rate of 1 to 1.5 ml / min. With seven stage temperature programming and an interface temperature of 450 °C the analysis is sensitive and specific.

Specifications
Gas Chromatography Specifications
Model No GC-87
Flow rate 1 ~ 1.5 ml / min
Maximum flow rate 10 ml / min
Inlet temperature 450 °C
Pressure range 0 ~ 100 psi
Heating rate Upto 120 °C / min
Room temperature 4 °C ~ 450 °C
Pressure control mode Electronic pressure control ( Supports CV and CC )
Split mode Split / split less
Split ratio 1000 : 1
Temperature programming 7 stages / 8 platforms
Auto sampler Optional
Mass Spectrometry Specifications
Model No MS-89
Mass range 1.5 ~ 1000 amu
Ion – source temperature 100 °C ~ 350 °C
GC-MS interface temperature 450 °C
Scan rate Upto 10000 amu/s
Stability ± 0.10 amu / 48 hrs.
Filament emission current 0 ~ 350 µA
EI source ionization energy 5 eV ~ 250 eV
Resolution Unit resolution
Detector High energy dynode electron multiplier
Sensitivity Full scan ( S / N is ≥ 30 : 1 )
Vacuum Turbo molecular pump ( 67 L/s )
 
Features
  • Column flow rate is 1 ~ 1.5 ml / min
  • Maximum flow rate is 10 ml / min
  • Simultaneous analysis with different components increasing productivity
  • Electronic flow control system
  • Mass analyzer with pre-filter reducing quadruple filtration
  • Turbo molecular pump vacuum system for stability and reliability
  • Software controlled auto sampler , gas chromatograph and mass spectrometer
  • Screens and quantifies more than 1000 compounds in a single run
Application
Used in identifying and quantifying volatile organic compounds in mixtures, testing residual solvents, identification of trace impurities in liquids or gases, evaluating extracts from plastics, contaminants on semiconductor wafers or other technology products.
 

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